Böckle, Stefan; Kazenwadel, Jan; Kunzelmann, Thomas; Shin, Dong-Ill; Schulz, Christof:
Single-shot laser-induced fluorescence imaging of formaldehyde with XeF excimer excitation
In: Applied Physics : B, Lasers and optics, Vol. 70 (2000), No. 5, pp. 733 - 735
2000article/chapter in journal
Mechanical Engineering
Title in English:
Single-shot laser-induced fluorescence imaging of formaldehyde with XeF excimer excitation
Author:
Böckle, Stefan;Kazenwadel, Jan;Kunzelmann, Thomas;Shin, Dong-Ill;Schulz, ChristofUDE
GND
1148037985
LSF ID
48807
ORCID
0000-0002-6879-4826ORCID iD
Other
connected with university
Year of publication:
2000
Language of text:
English