Siesler, Heinz Wilhelm:
Quality control and process monitoring by mid infrared, near infrared and Raman spectroscopy : A comparison
In: Near Infrared Spectroscopy : Proceedings of the International Conference, 9th, Verona, Italy, June 13-18, 1999 - International Conference, 9th, Verona, Italy, June 13-18, 1999 - Chichester: NIR Publ., 2000, pp. 331 - 337
2000book article/chapter in Proceedings
Chemistry
Title in English:
Quality control and process monitoring by mid infrared, near infrared and Raman spectroscopy : A comparison
Author:
Siesler, Heinz WilhelmUDE
LSF ID
11044
ORCID
0000-0002-6791-9965ORCID iD
Other
connected with university
Year of publication:
2000
Language of text:
English
Appears in
Near Infrared Spectroscopy : Proceedings of the International Conference, 9th, Verona, Italy, June 13-18, 1999
Conference
International Conference, 9th, Verona, Italy, June 13-18, 1999
Place of publication:
Chichester
Publisher:
NIR Publ.
Year of publication:
2000
in:
pp. 331 - 337
ISBN
0-9528666-1-7