Wende, Heiko; Scherz, A.; Sorg, C.; Baberschke, K.; Gross, E. K. U.; Appel, H.; Burke, K.; Minár, J.; Ebert, H.; Ankudinov, A. L.; Rehr, J. J.:
XMCD Analysis Beyond Standard Procedures
In: X-ray absorption fine structure - XAFS 13 : 13th international conference, Stanford, California, U.S.A., 9 - 14 July 2006 / Hedman, Britt; Pianetta, Piero (Eds.). - 13th International Conference on X-ray absorption fine structure ; XAFS 13 ; 9 - 14 July 2006, Stanford, California, USA - Melville: American Inst. of Physics, 2007 - (AIP Conference Proceedings ; 882), pp. 78 - 82
2007book article/chapter in Proceedings
Physics (incl. Astronomy)
Related: 1 publication(s)
Title in English:
XMCD Analysis Beyond Standard Procedures
Author:
Wende, HeikoUDE
GND
12115226X
LSF ID
47290
ORCID
0000-0001-8395-3541ORCID iD
Other
connected with university
;Scherz, A.;Sorg, C.;Baberschke, K.;Gross, E. K. U.;Appel, H.;Burke, K.;Minár, J.;Ebert, H.;Ankudinov, A. L.;Rehr, J. J.
DOI
10.1063/1.2644435
Language of text:
English
Appears in
X-ray absorption fine structure - XAFS 13 : 13th international conference, Stanford, California, U.S.A., 9 - 14 July 2006
Conference
13th International Conference on X-ray absorption fine structure ; XAFS 13 ; 9 - 14 July 2006, Stanford, California, USA
Editor:
Hedman, Britt;Pianetta, Piero
Place of publication:
Melville
Publisher:
American Inst. of Physics
Year of publication:
2007
in:
pp. 78 - 82
ISBN
978-0-7354-0384-0
Language of text:
English
In Series
AIP Conference Proceedings
in:
Vol. 882