Stahlmecke, Burkhard; Dumpich, Günter:
Influence of the Electron Beam on Electromigration Measurements within a Scanning Electron Microscope.
In: Applied Physics Letters, Band 90 (2007), S. 043517
2007Artikel/Aufsatz in ZeitschriftPhysik
Titel:
Influence of the Electron Beam on Electromigration Measurements within a Scanning Electron Microscope.
Autor(in):
Stahlmecke, Burkhard; Dumpich, GünterLSF
Erscheinungsjahr
2007