Stahlmecke, Burkhard; Dumpich, Günter:
Influence of the Electron Beam on Electromigration Measurements within a Scanning Electron Microscope.
In: Applied Physics Letters, Vol. 90 (2007), p. 043517
2007article/chapter in journal
Physics (incl. Astronomy)
Title:
Influence of the Electron Beam on Electromigration Measurements within a Scanning Electron Microscope.
Author:
Stahlmecke, Burkhard;Dumpich, GünterUDE
LSF ID
1107
Other
connected with university
Year of publication:
2007
Appears in
Applied Physics Letters
in:
Vol. 90 (2007), p. 043517
ISSN
0003-6951 Show availability online & print
Library shelfmark:
67 A 21