Microwave spectroscopy detected by scanning thermal microscopy : resolution in the nanometer range ; invited review article
In: Review of Scientific Instruments, Vol. 79 (2008), pp. 041101-1 - 041101-29
2008article/chapter in journal
Physics (incl. Astronomy)Scientific institutes » Center for Nanointegration Duisburg-Essen (CENIDE)
Related: 1 publication(s)
Title in English:
Microwave spectroscopy detected by scanning thermal microscopy : resolution in the nanometer range ; invited review article
Author:
Meckenstock, RalfUDE
- LSF ID
- 46939
- ORCID
-
0009-0002-6537-0646
- Other
- connected with university
Year of publication:
2008
Language of text:
English
Appears in
Title in English (abbreviated):
Rev. Sci. Instrum.
Title in English (abbreviated):
Rev. of Sci. Instrum.
Place of publication:
Melville
Publisher:
American Institute of Physics (AIP)
in:
Vol. 79 (2008), pp. 041101-1 - 041101-29
ISSN
ISSN
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