Klein, C.; Ramchal, R.; Schmid, A.K.; Farle, Michael:
Direct imaging of spin-reorientation transitions in ultrathin Ni films by spin-polarized low-energy electron microscopy.
In: Surface and Interface Analysis, Vol. 38 (2006), No. 12-13, pp. 1550 - 1553
2006article/chapter in journal
Physics (incl. Astronomy)
Title:
Direct imaging of spin-reorientation transitions in ultrathin Ni films by spin-polarized low-energy electron microscopy.
Author:
Klein, C.;Ramchal, R.;Schmid, A.K.;Farle, MichaelUDE
GND
1029383219
LSF ID
3560
ORCID
0000-0002-1864-3261ORCID iD
Other
connected with university
Year of publication:
2006
Appears in
Surface and Interface Analysis
in:
Vol. 38 (2006), No. 12-13, pp. 1550 - 1553
Library shelfmark:
67 Z 6