Davies, Patrick Laurie; Meise, Monika:
Residual based localization and quantification of peaks in x-ray diffractograms
In: Annals of Applied Statistics, Jg. 2 (2008), Heft 3, S. 861 - 886
2008Artikel/Aufsatz in ZeitschriftMathematik
Titel:
Residual based localization and quantification of peaks in x-ray diffractograms
Autor(in):
Davies, Patrick LaurieLSF; Meise, MonikaLSF
Erscheinungsjahr
2008