Davies, Patrick Laurie; Meise, Monika:
Residual based localization and quantification of peaks in x-ray diffractograms
In: Annals of Applied Statistics, Vol. 2 (2008), No. 3, pp. 861 - 886
2008article/chapter in journal
Mathematics
Title:
Residual based localization and quantification of peaks in x-ray diffractograms
Author:
Davies, Patrick LaurieUDE
LSF ID
5085
Other
connected with university
;
Meise, MonikaUDE
LSF ID
5187
Other
connected with university
Year of publication:
2008