Jerman, Martin; Qiao, Zhaohui; Mergel, Dieter:
Refractive index of thin films of SiO2, ZrO2, and HfO2 as a function of the films' mass density
In: Applied Optics, Jg. 44 (2005), Heft 15, S. 3006 - 3012
2005Artikel/Aufsatz in ZeitschriftPhysik
Titel:
Refractive index of thin films of SiO2, ZrO2, and HfO2 as a function of the films' mass density
Autor(in):
Jerman, MartinLSF; Qiao, Zhaohui; Mergel, DieterLSF
Erscheinungsjahr
2005