Yang, Huinan; Greszik, Daniel; Dreier, Thomas; Schulz, Christof:
Simultaneous measurement of liquid water film thickness and vapor temperature using near-infrared tunable diode laser spectroscopy
In: Applied Physics B : Lasers and Optics, Vol. 99 (2010), No. 3, pp. 385 - 390
2010article/chapter in journal
Mechanical EngineeringFaculty of Engineering » Maschinenbau und Verfahrenstechnik » Institute for Energy and Materials Processes (EMPI)
Related: 1 publication(s)
Title in English:
Simultaneous measurement of liquid water film thickness and vapor temperature using near-infrared tunable diode laser spectroscopy
Author:
Yang, HuinanUDE
LSF ID
50301
Other
connected with university
;Greszik, DanielUDE
LSF ID
49366
Other
connected with university
;Dreier, ThomasUDE
LSF ID
47223
ORCID
0000-0001-8313-4992ORCID iD
Other
connected with university
;Schulz, ChristofUDE
GND
1148037985
LSF ID
48807
ORCID
0000-0002-6879-4826ORCID iD
Other
connected with university
Year of publication:
2010
DOI
10.1007/s00340-010-3980-3
Scopus ID
77955869146
Language of text:
English
Appears in
Applied Physics B : Lasers and Optics
Title in English (abbreviated):
Appl Phys B
Place of publication:
Berlin
Publisher:
Springer
in:
Vol. 99 (2010), No. 3, pp. 385 - 390
ISSN
0946-2171 Show availability online & print
ISSN
1432-0649 Show availability online & print
ISSN
0721-7269 Show availability online & print
ZDB ID
1458437-2
Note:
Ab 26.1981-