Lochthofen, André; Mertin, Wolfgang; Bacher, Gerd; Hoeppel, Lutz; Bader, Stefan; Off, Johannes; Hahn, Berthold:
Electrical investigation of V-defects in GaN using Kelvin probe and conductive atomic force microscopy
In: Applied Physics Letters (APL), Vol. 93 (2008), No. 2, p. 022107
2008article/chapter in journal
Electrical Engineering and Information TechnologyPhysics (incl. Astronomy)Materials EngineeringScientific institutes » Center for Nanointegration Duisburg-Essen (CENIDE)
Related: 1 publication(s)
Title in English:
Electrical investigation of V-defects in GaN using Kelvin probe and conductive atomic force microscopy
Author:
Lochthofen, André;Mertin, WolfgangUDE
LSF ID
1452
ORCID
0000-0001-6792-6033ORCID iD
Other
connected with university
;Bacher, GerdUDE
GND
110666038
LSF ID
3929
ORCID
0000-0001-8419-2158ORCID iD
Other
connected with university
;Hoeppel, Lutz;Bader, Stefan;Off, Johannes;Hahn, Berthold
Year of publication:
2008
DOI
10.1063/1.2953081
Language of text:
English
Appears in
Applied Physics Letters (APL)
Title in English (abbreviated):
Appl Phys Lett
Title in English (alternative):
Applied physics letters online
Place of publication:
College Park
Publisher:
American Institute of Physics (AIP)
in:
Vol. 93 (2008), No. 2, p. 022107
ISSN
0003-6951 Show availability online & print
ISSN
1077-3118 Show availability online & print
ZDB ID
1469436-0