Mertin, Wolfgang:
Contactless probing of high-frequency electrical signals with scanning probe microscopy
In: 2002 IEEE MTT-S International Microwave Symposium digest : June 2 - 7, 2002, Washington (Vol. 3) / Hamilton, Rob (Eds.). - Piscataway, NJ: IEEE, 2002, pp. 1493 - 1496
2002book article/chapter in collection
Electrical Engineering and Information TechnologyPhysics (incl. Astronomy)Materials Engineering
Title:
Contactless probing of high-frequency electrical signals with scanning probe microscopy
Author:
Mertin, WolfgangUDE
LSF ID
1452
ORCID
0000-0001-6792-6033ORCID iD
Other
connected with university
Appears in
2002 IEEE MTT-S International Microwave Symposium digest : June 2 - 7, 2002, Washington (Vol. 3)
Editor:
Hamilton, Rob
Place of publication:
Piscataway, NJ
Publisher:
IEEE
Year of publication:
2002
in:
pp. 1493 - 1496
ISBN
0-7803-7239-5