Schulze-Kraasch, Folkert; Velling, Peter; Prost, Werner:
Characterisation of ultra-thin III/V-heterostructures by convergent-beam-electron- and high-resolution-X-ray-diffraction
In: Materials Science and Engineering B : Solid-State Materials for Advanced Technology, Vol. 110 (2004), No. 2, pp. 161 - 167
2004article/chapter in journal
Electrical Engineering and Information TechnologyFaculty of Engineering » Engineering and Information Technology » Bauelemente der Höchstfrequenzelektronik
Title in English:
Characterisation of ultra-thin III/V-heterostructures by convergent-beam-electron- and high-resolution-X-ray-diffraction
Author:
Schulze-Kraasch, FolkertUDE
LSF ID
1458
Other
connected with university
;Velling, PeterUDE
LSF ID
1460
Other
connected with university
;Prost, WernerUDE
LSF ID
1459
ORCID
0000-0003-0249-5927ORCID iD
Other
connected with university
Year of publication:
2004
DOI
10.1016/j.mseb.2004.01.021
Scopus ID
2442719312
Language of text:
English
Appears in
Materials Science and Engineering B : Solid-State Materials for Advanced Technology
Place of publication:
Amsterdam
Publisher:
Elsevier
in:
Vol. 110 (2004), No. 2, pp. 161 - 167
ISSN
0921-5107 Show availability online & print
ISSN
1873-4944 Show availability online & print
ZDB ID
1492109-1