Niesar, Sabrina; Stegner, Andre R.; Pereira, Rui N.; Hoeb, Maximilian; Wiggers, Hartmut; Brandt, Martin; Stutzmann, Martin:
Defect reduction in silicon nanoparticles by low-temperature vacuum annealing
In: Applied Physics Letters (APL), Vol. 96 (2010), No. 19, p. 193112
2010article/chapter in journal
Mechanical EngineeringScientific institutes » Center for Nanointegration Duisburg-Essen (CENIDE)
Related: 1 publication(s)
Title in English:
Defect reduction in silicon nanoparticles by low-temperature vacuum annealing
Author:
Niesar, Sabrina;Stegner, Andre R.;Pereira, Rui N.;Hoeb, Maximilian;Wiggers, HartmutUDE
GND
172637171
LSF ID
1643
ORCID
0000-0001-8487-9937ORCID iD
Other
connected with university
;Brandt, Martin;Stutzmann, Martin
Year of publication:
2010
DOI
10.1063/1.3428359
Language of text:
English
Appears in
Applied Physics Letters (APL)
Title in English (abbreviated):
Appl Phys Lett
Title in English (alternative):
Applied physics letters online
Place of publication:
College Park
Publisher:
American Institute of Physics (AIP)
in:
Vol. 96 (2010), No. 19, p. 193112
ISSN
0003-6951 Show availability online & print
ISSN
1077-3118 Show availability online & print
ZDB ID
1469436-0