Wiggers, Hartmut; Hülser, Tim-Patrick; Kennedy, Marcus; Kruis, Frank Einar; Fissan, Heinz; Lorke, Axel; Roth, Paul:
Electrical Properties of Nanocrystalline SnO2 Thin Film Sensors Investigated with Impedance Spectroscopy
In: Emerging applications in electronics, optoelectronics, energy and sensors : Chemical Nanotechnology Talks IV ; 01 - 02 October 2003, DECHEMA-Building, Frankfurt am Main - Frankfurt/Main, 2003
2003book article/chapter in collection
Mechanical Engineering
Title:
Electrical Properties of Nanocrystalline SnO2 Thin Film Sensors Investigated with Impedance Spectroscopy
Author:
Wiggers, HartmutUDE
GND
172637171
LSF ID
1643
ORCID
0000-0001-8487-9937ORCID iD
Other
connected with university
;Hülser, Tim-PatrickUDE
LSF ID
48386
Other
connected with university
;Kennedy, MarcusUDE
LSF ID
2853
Other
connected with university
;Kruis, Frank EinarUDE
GND
1208325426
LSF ID
3631
ORCID
0000-0001-5008-8133ORCID iD
Other
connected with university
;Fissan, HeinzUDE
GND
13688721X
LSF ID
1263
Other
connected with university
;Lorke, AxelUDE
GND
1042619697
LSF ID
2509
ORCID
0000-0002-0405-7720ORCID iD
Other
connected with university
;Roth, PaulUDE
LSF ID
1010
Other
connected with university
Appears in
Emerging applications in electronics, optoelectronics, energy and sensors : Chemical Nanotechnology Talks IV ; 01 - 02 October 2003, DECHEMA-Building, Frankfurt am Main
Place of publication:
Frankfurt/Main
Year of publication:
2003