Phonon confinement effects in ultrathin epitaxial bismuth films on silicon studied by time-resolved electron diffraction
In: Physical Review B : Condensed matter and materials physics, Vol. 80 (2009), No. 2, p. 24307
2009article/chapter in journal
Physics (incl. Astronomy)Faculty of Physics » Experimental PhysicsScientific institutes » Center for Nanointegration Duisburg-Essen (CENIDE)
Related: 1 publication(s)
Title in English:
Phonon confinement effects in ultrathin epitaxial bismuth films on silicon studied by time-resolved electron diffraction
Author:
Krenzer, Boris;Hanisch-Blicharski, AnjaUDE
- LSF ID
- 12007
- Other
- connected with university
- LSF ID
- 46752
- Other
- connected with university
- LSF ID
- 49749
- Other
- connected with university
- LSF ID
- 50189
- Other
- connected with university
- LSF ID
- 13388
- Other
- connected with university
- GND
- 1201039908
- LSF ID
- 10366
- ORCID
- 0000-0003-0324-3457
- Other
- connected with university
Year of publication:
2009
Language of text:
English