Hattab, Hichem; Zubkov, E.; Bernhart, Alexander; Jnawali, Giriraj; Bobisch, Christian; Krenzer, Boris; Acet, Mehmet; Möller, Rolf; Horn-von Hoegen, Michael:
Epitaxial Bi(111) films on Si(001) : strain state, surface morphology, and defect structure
In: Thin Solid Films, Vol. 516 (2008), No. 23, pp. 8227 - 8231
2008article/chapter in journal
Physics (incl. Astronomy)Faculty of Physics » Experimental PhysicsScientific institutes » Center for Nanointegration Duisburg-Essen (CENIDE)
Related: 1 publication(s)
Title in English:
Epitaxial Bi(111) films on Si(001) : strain state, surface morphology, and defect structure
Author:
Hattab, HichemUDE
LSF ID
49259
Other
connected with university
;Zubkov, E.;Bernhart, AlexanderUDE
LSF ID
49933
Other
connected with university
;Jnawali, GirirajUDE
LSF ID
10417
ORCID
0000-0003-0954-8614ORCID iD
Other
connected with university
;Bobisch, ChristianUDE
LSF ID
10408
Other
connected with university
;Krenzer, Boris;Acet, MehmetUDE
LSF ID
2917
ORCID
0000-0003-3601-1601ORCID iD
Other
connected with university
;Möller, RolfUDE
GND
1252401639
LSF ID
10359
ORCID
0000-0003-1924-8615ORCID iD
Other
connected with university
;Horn-von Hoegen, MichaelUDE
GND
1201039908
LSF ID
10366
ORCID
0000-0003-0324-3457ORCID iD
Other
connected with university
Year of publication:
2008
DOI
10.1016/j.tsf.2008.02.038
Language of text:
English
Appears in
Thin Solid Films
Place of publication:
Amsterdam
Publisher:
Elsevier
in:
Vol. 516 (2008), No. 23, pp. 8227 - 8231
ISSN
0040-6090 Show availability online & print
ISSN
1879-2731 Show availability online & print
ZDB ID
1482896-0