Jnawali, Giriraj; Hattab, Hichem; Bobisch, Christian A.; Bernhart, Alexander M.; Zubkov, E.; Möller, Rolf; Horn-von Hoegen, Michael:
Nanoscale dislocation patterning in Bi(1 1 1)/Si(0 0 1) heteroepitaxy
In: Surface Science, Vol. 603 (2009), No. 13, pp. 2057 - 2061
2009article/chapter in journal
Physics (incl. Astronomy)Faculty of Physics » Experimental PhysicsScientific institutes » Center for Nanointegration Duisburg-Essen (CENIDE)
Related: 1 publication(s)
Title in English:
Nanoscale dislocation patterning in Bi(1 1 1)/Si(0 0 1) heteroepitaxy
Author:
Jnawali, GirirajUDE
LSF ID
10417
ORCID
0000-0003-0954-8614ORCID iD
Other
connected with university
corresponding author
;
Hattab, HichemUDE
LSF ID
49259
Other
connected with university
;
Bobisch, Christian A.UDE
LSF ID
10408
Other
connected with university
;
Bernhart, Alexander M.UDE
LSF ID
49933
Other
connected with university
;
Zubkov, E.
;
Möller, RolfUDE
GND
1252401639
LSF ID
10359
ORCID
0000-0003-1924-8615ORCID iD
Other
connected with university
;
Horn-von Hoegen, MichaelUDE
GND
1201039908
LSF ID
10366
ORCID
0000-0003-0324-3457ORCID iD
Other
connected with university
Year of publication:
2009
Scopus ID
Language of text:
English