Thermal Boundary Conductance in Heterostructures Studied by Ultrafast Electron Diffraction,
In: New Journal of Physics (NJP), Vol. 8 (2006), p. 190
2006article/chapter in journal
Physics (incl. Astronomy)Faculty of Physics » Experimental Physics
Related: 1 publication(s)
Title:
Thermal Boundary Conductance in Heterostructures Studied by Ultrafast Electron Diffraction,
Author:
Krenzer, B.;Janzen, A.;Zhou, PingUDE
- LSF ID
- 10448
- Other
- connected with university
- GND
- 121993092X
- LSF ID
- 10402
- ORCID
- 0000-0001-5618-3879
- Other
- connected with university
- GND
- 1201039908
- LSF ID
- 10366
- ORCID
- 0000-0003-0324-3457
- Other
- connected with university
Year of publication:
2006
Abstract:
Ultrafast electron diffraction (UED) at surfaces is used to study the energy dissipation in ultrathin epitaxial Bi-films on Si(001) subsequent to fs laser pulse excitation. The temperature of the Bi-film is determined from the drop in diffraction intensity due to the Debye–Waller effect. A temperature rise from 80 to 200 K is followed by an exponential cooling with a time constant of 640 ps. The cooling rate of the Bi-film is determined by the reflection of phonons at the Bi/Si interface and is slower than expected from the acoustic and diffusive mismatch model.