Pennec, Y.; Horn-von Hoegen, Michael; Zhu, Xiaobin; Fortin, D.C.; Freeman, M.R.:
Dynamics of an Ising chain under local excitation: An STM study of Si(100) dimer rows at T = 5K
In: Physical Review Letters, Vol. 96 (2006), No. 2, 26102 (4p)
2006article/chapter in journal
Physics (incl. Astronomy)Faculty of Physics » Experimental Physics
Related: 1 publication(s)
Title:
Dynamics of an Ising chain under local excitation: An STM study of Si(100) dimer rows at T = 5K
Author:
Pennec, Y.;Horn-von Hoegen, MichaelUDE
GND
1201039908
LSF ID
10366
ORCID
0000-0003-0324-3457ORCID iD
Other
connected with university
;Zhu, Xiaobin;Fortin, D.C.;Freeman, M.R.
Year of publication:
2006
WWW URL:
http://prl.aps.org/abstract/PRL/v96/i2/e026102
Appears in
Physical Review Letters
Place of publication:
College Park
Publisher:
American Physical Society (APS)
in:
Vol. 96 (2006), No. 2, 26102 (4p)
ISSN
1079-7114 Show availability online & print
ISSN
0031-9007 Show availability online & print
ZDB ID
1472655-5
Library shelfmark:
67 P 8

Abstract:

An extension of the classical Ising model to a situation including a source of spin-flip excitations localized on the scale of individual spins is considered. The scenario is realized by scanning tunneling microscopy of the Si(100) surface at low temperatures. Remarkable details, corresponding to the passage of phasons through the tunnel junction, are detected by the STM within the short span between two atoms comprising an individual Si dimer.