Reconstruction dependent orientation of Ag(111) films on Si(001)
In: Physical Review B : Condensed matter and materials physics, Jg. 52 (1995), Heft 19, S. 13745 - 13748
1995Artikel/Aufsatz in Zeitschrift
Physik (inkl. Astronomie)Fakultät für Physik » Experimentalphysik
Damit verbunden: 1 Publikation(en)
Titel:
Reconstruction dependent orientation of Ag(111) films on Si(001)
Autor*in:
Fölsch, S.;Meyer, G.;Winau, D.;Rieder, K.H.;Schmidt, T.;Horn-von Hoegen, MichaelUDE
- GND
- 1201039908
- LSF ID
- 10366
- ORCID
-
0000-0003-0324-3457
- Sonstiges
- der Hochschule zugeordnete*r Autor*in
Erscheinungsjahr:
1995
Erscheinungsort:
College Park
Verlag:
American Physical Society (APS)
in:
Jg. 52 (1995), Heft 19, S. 13745 - 13748
ISSN
ISSN
ISSN
ISSN
ZDB ID
Signatur der UB:
Notiz:
1.1970 - 92.2015
Abstract:
The growth of Ag on 4°-misoriented, single-domain Si(001) surfaces at 130 K yields continuous and epitaxial overlayers with a (111) orientation. The close-packed rows of Ag atoms are parallel to the (2×1) dimer rows and run perpendicular to the step edges. The dimer orientation can be rotated by 90° by inducing a (3×2) reconstruction on the Si(001) surface. Again, single-crystal Ag(111) films are obtained; however, their in-plane orientation is now rotated by 90°. In this case, the close-packed rows of Ag atoms are aligned parallel to the step edges.