Reconstruction dependent orientation of Ag(111) films on Si(001)
In: Physical Review B : Condensed matter and materials physics, Vol. 52 (1995), No. 19, pp. 13745 - 13748
1995article/chapter in journal
Physics (incl. Astronomy)Faculty of Physics » Experimental Physics
Related: 1 publication(s)
Title:
Reconstruction dependent orientation of Ag(111) films on Si(001)
Author:
Fölsch, S.;Meyer, G.;Winau, D.;Rieder, K.H.;Schmidt, T.;Horn-von Hoegen, MichaelUDE
- GND
- 1201039908
- LSF ID
- 10366
- ORCID
-
0000-0003-0324-3457
- Other
- connected with university
Year of publication:
1995
Place of publication:
College Park
Publisher:
American Physical Society (APS)
in:
Vol. 52 (1995), No. 19, pp. 13745 - 13748
ISSN
ISSN
ISSN
ISSN
ZDB ID
Library shelfmark:
Note:
1.1970 - 92.2015
Abstract:
The growth of Ag on 4°-misoriented, single-domain Si(001) surfaces at 130 K yields continuous and epitaxial overlayers with a (111) orientation. The close-packed rows of Ag atoms are parallel to the (2×1) dimer rows and run perpendicular to the step edges. The dimer orientation can be rotated by 90° by inducing a (3×2) reconstruction on the Si(001) surface. Again, single-crystal Ag(111) films are obtained; however, their in-plane orientation is now rotated by 90°. In this case, the close-packed rows of Ag atoms are aligned parallel to the step edges.