Hopster, Johannes; Diesing, Detlef; Wucher, Andreas; Schleberger, Marika:
Comparison of ion beam and electron beam induced transport of hot charge carriers in metal-insulator-metal junctions
In: Ion beams : new applications from mesoscale to nanoscale - 2011 MRS Spring Meeting, April 25 - 29, San Francisco, California, USA - New York: Cambridge Univ. Press, 2011 - (Materials Research Society symposium proceedings ; 1354)
2011Buchaufsatz/Kapitel in TagungsbandChemie
Fakultät für PhysikFakultät für Chemie » Physikalische Chemie
Titel:
Comparison of ion beam and electron beam induced transport of hot charge carriers in metal-insulator-metal junctions
Autor(in):
Hopster, JohannesLSF; Diesing, DetlefLSF; Wucher, AndreasLSF; Schleberger, MarikaLSF
DOI:
Scopus ID: