Siesler, Heinz Wilhelm:
Quality control and process monitoring by mid infrared, near infrared and Raman spectroscopy : A comparison
In: Near Infrared Spectroscopy : Proceedings of the International Conference, 9th, Verona, Italy, June 13-18, 1999 - International Conference, 9th, Verona, Italy, June 13-18, 1999 - Chichester: NIR Publ., 2000, S. 331 - 337
2000Buchaufsatz/Kapitel in Tagungsband
Chemie
Titel in Englisch:
Quality control and process monitoring by mid infrared, near infrared and Raman spectroscopy : A comparison
Autor*in:
Siesler, Heinz WilhelmUDE
LSF ID
11044
ORCID
0000-0002-6791-9965ORCID iD
Sonstiges
der Hochschule zugeordnete*r Autor*in
Erscheinungsjahr:
2000
Sprache des Textes:
Englisch