Hülsen, Björn; Scheffler, Matthias; Kratzer, Peter:
Structural Stability and Magnetic and Electronic Properties of Co_2MnSi(001)/MgO Heterostructures: A Density-Functional Theory Study
In: Physical Review Letters, Band 103 (2009), S. 046802/1-4
2009Artikel/Aufsatz in Zeitschrift
Physik (inkl. Astronomie)
Damit verbunden: 1 Publikation(en)
Titel:
Structural Stability and Magnetic and Electronic Properties of Co_2MnSi(001)/MgO Heterostructures: A Density-Functional Theory Study
Autor*in:
Hülsen, Björn;Scheffler, Matthias;Kratzer, PeterUDE
GND
105650420
LSF ID
14826
ORCID
0000-0001-5947-1366ORCID iD
ORCID
0000-0003-4790-4616ORCID iD
Sonstiges
der Hochschule zugeordnete*r Autor*in
Erscheinungsjahr:
2009

Abstract:

A computational study of the epitaxial Co_2MnSi(001)/MgO(001) interface relevant to tunneling magnetoresistive devices is presented. Employing ab initio atomistic thermodynamics, we show that the Co or MnSi planes of bulk-terminated Co_2MnSi form stable interfaces, while pure Si or pure Mn termination requires nonequilibrium conditions. Except for the pure Mn interface, the half-metallic property of bulk Co_2MnSi is disrupted by interface bands. Even so, at homogeneous Mn or Co interfaces these bands contribute little to the minority-spin conductance through an MgO barrier, and hence such terminations could perform strongly in tunneling magnetoresistive devices.