Pennec, Y.; Horn-von Hoegen, Michael; Zhu, Xiaobin; Fortin, D.C.; Freeman, M.R.:
Dynamics of an Ising chain under local excitation: An STM study of Si(100) dimer rows at T = 5K
In: Physical Review Letters, Jg. 96 (2006), Heft 2, 26102 (4p)
2006Artikel/Aufsatz in Zeitschrift
Physik (inkl. Astronomie)Fakultät für Physik » Experimentalphysik
Damit verbunden: 1 Publikation(en)
Titel:
Dynamics of an Ising chain under local excitation: An STM study of Si(100) dimer rows at T = 5K
Autor*in:
Pennec, Y.;Horn-von Hoegen, MichaelUDE
GND
1201039908
LSF ID
10366
ORCID
0000-0003-0324-3457ORCID iD
Sonstiges
der Hochschule zugeordnete*r Autor*in
;
Zhu, Xiaobin;Fortin, D.C.;Freeman, M.R.
Erscheinungsjahr:
2006

Abstract:

An extension of the classical Ising model to a situation including a source of spin-flip excitations localized on the scale of individual spins is considered. The scenario is realized by scanning tunneling microscopy of the Si(100) surface at low temperatures. Remarkable details, corresponding to the passage of phasons through the tunnel junction, are detected by the STM within the short span between two atoms comprising an individual Si dimer.