Siders, Craig W.; Cavalleri, Andrea; Sokolowski-Tinten, Klaus; Toth, Csabe; Guo, Ting; Kammler, Martin; Horn-von Hoegen, Michael; Wilson, Kent R.; von der Linde, Dietrich; Barty, Christopher P.P.:
Detection of nonthermal melting by ultrafast X-ray diffraction
In: Science, Jg. 286 (1999), Heft 5443, S. 1340 - 1342
1999Artikel/Aufsatz in Zeitschrift
Physik (inkl. Astronomie)Fakultät für Physik » Experimentalphysik
Titel:
Detection of nonthermal melting by ultrafast X-ray diffraction
Autor*in:
Siders, Craig W.;Cavalleri, Andrea;Sokolowski-Tinten, KlausUDE
GND
172725364
LSF ID
13459
ORCID
0000-0002-7979-5357ORCID iD
Sonstiges
der Hochschule zugeordnete*r Autor*in
;
Toth, Csabe;Guo, Ting;Kammler, MartinUDE
LSF ID
50189
Sonstiges
der Hochschule zugeordnete*r Autor*in
;
Horn-von Hoegen, MichaelUDE
GND
1201039908
LSF ID
10366
ORCID
0000-0003-0324-3457ORCID iD
Sonstiges
der Hochschule zugeordnete*r Autor*in
;
Wilson, Kent R.;von der Linde, DietrichUDE
GND
121993092X
LSF ID
10402
ORCID
0000-0001-5618-3879ORCID iD
Sonstiges
der Hochschule zugeordnete*r Autor*in
;
Barty, Christopher P.P.
Erscheinungsjahr:
1999

Abstract:

Using ultrafast, time-resolved, 1.54 angstrom x-ray diffraction, thermal and ultrafast nonthermal melting of germanium, involving passage through nonequilibrium extreme states of matter, was observed. Such ultrafast, optical-pump, x-ray diffraction probe measurements provide a way to study many other transient processes in physics, chemistry, and biology, including direct observation of the atomic motion by which many solid-state processes and chemical and biochemical reactions take place.