Lu, Wei; Nicoul, Matthieu; Shymanovich, Uladzimir; Tarasevitch, Alexander; Horn-von Hoegen, Michael; von der Linde, Dietrich; Sokolowski-Tinten, Klaus:
A modular table-top setup for ultrafast X-ray diffraction
In: Review of Scientific Instruments, Vol. 95 (2024), Article 013002
2024article/chapter in journalOA Green
Physics (incl. Astronomy)Scientific institutes » Center for Nanointegration Duisburg-Essen (CENIDE)
Related: 1 publication(s)
Title in English:
A modular table-top setup for ultrafast X-ray diffraction
Author:
Lu, WeiUDE
LSF ID
12041
ORCID
0000-0002-2573-5738ORCID iD
Other
connected with university
;
Nicoul, Matthieu
ORCID
0000-0003-4498-733XORCID iD
;
Shymanovich, UladzimirUDE
LSF ID
10438
ORCID
0000-0003-3451-1979ORCID iD
Other
connected with university
;
Tarasevitch, AlexanderUDE
LSF ID
10443
ORCID
0000-0003-2621-8000ORCID iD
Other
connected with university
;
Horn-von Hoegen, MichaelUDE
GND
1201039908
LSF ID
10366
ORCID
0000-0003-0324-3457ORCID iD
Other
connected with university
;
von der Linde, DietrichUDE
GND
121993092X
LSF ID
10402
ORCID
0000-0001-5618-3879ORCID iD
Other
connected with university
;
Sokolowski-Tinten, KlausUDE
GND
172725364
LSF ID
13459
ORCID
0000-0002-7979-5357ORCID iD
Other
connected with university
corresponding author
Year of publication:
2024
Open Access?:
OA Green
arXiv.org ID
Web of Science ID
PubMed ID
Language of text:
English
Type of resource:
Text

Abstract:

We present a table-top setup for femtosecond time-resolved X-ray diffraction based on a Cu K{\alpha} (8.05 keV) laser driven plasma X-ray source. Due to its modular design it provides high accessibility to its individual components (e.g. X-ray optics and sample environment). The K{\alpha}-yield of the source is optimized using a pre-pulse scheme. A magnifying multilayer X-ray mirror with Montel-Helios geometry is used to collect the emitted radiation, resulting in a quasi-collimated flux of more than 105 Cu K{\alpha} photons/pulse impinging on the sample under investigation at a repetition rate of 10 Hz. A gas ionization chamber detector is placed right after the X-ray mirror and used for normalization of the diffraction signals enabling the measurement of relative signal changes of less than 1% even at the given low repetition rate. Time-resolved diffraction experiments on laser-excited epitaxial Bi films serve as an example to demonstrate the capabilities of the set-up. The set-up can also be used for Debye-Scherrer type measurements on poly-crystalline samples.