Antiferromagnetic layer thickness dependence of the IrMn/Co exchange-bias system
In: Physical Review B : Condensed matter and materials physics, Vol. 68 (2003), No. 21, p. 214420 (7 Seiten)
Title:
Antiferromagnetic layer thickness dependence of the IrMn/Co exchange-bias system
Author:
Ali, Mannan;Marrows, Christopher H.;Al-Jawad, Maisoon;Hickey, Bryan J.;Misra, Arkajyoti;Nowak, Ulrich;Usadel, KlausUDE
- LSF ID
- 1126
- Other
- connected with university
Year of publication:
2003
Place of publication:
College Park
Publisher:
American Physical Society (APS)
in:
Vol. 68 (2003), No. 21, p. 214420 (7 Seiten)
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1.1970 - 92.2015