Chen, Hongtian; Jiang, Bin; Ding, Steven X.; Lu, Ningyun; Chen, Wen:
Probability-Relevant Incipient Fault Detection and Diagnosis Methodology With Applications to Electric Drive Systems
In: IEEE Transactions on Control Systems Technology (T-CST), Vol. 27 (2019), No. 6, pp. 2766 - 2773
2019article/chapter in journalClosed access
Electrical Engineering and Information TechnologyFaculty of Engineering » Engineering and Information Technology » Automatic Control and Complex Systems
Related: 1 publication(s)
Title in English:
Probability-Relevant Incipient Fault Detection and Diagnosis Methodology With Applications to Electric Drive Systems
Author:
Chen, Hongtian
ORCID
0000-0002-8600-9668ORCID iD
;Jiang, Bin
ORCID
0000-0002-9153-4360ORCID iD
;Ding, Steven X.UDE
GND
134302427
LSF ID
2347
ORCID
0000-0002-5149-5918ORCID iD
Other
connected with university
;Lu, Ningyun
ORCID
0000-0002-9964-7677ORCID iD
;Chen, Wen
ORCID
0000-0002-8726-8602ORCID iD
Year of publication:
2019
Open Access?:
Closed access
DOI
10.1109/TCST.2018.2866976
IEEE ID
8457495
Scopus ID
85053127861
Language of text:
English
Appears in
IEEE Transactions on Control Systems Technology (T-CST)
Title in English (abbreviated):
IEEE Trans Control Syst Technol
Place of publication:
Piscataway
Publisher:
IEEE
in:
Vol. 27 (2019), No. 6, pp. 2766 - 2773
ISSN
1558-0865 Show availability online & print
ISSN
1063-6536 Show availability online & print
ZDB ID
2027378-2
Library shelfmark:
88 Z 168
Type of resource:
Text
Keyword, Topic:
Bayes methods ; Bayesian inference ; electric drive systems ; Fault detection ; incipient faults ; Kullback-Leibler divergence (KLD) ; Mathematical analysis ; Principal component analysis ; probability-relevant principal component analysis (PRPCA). ; Standards