Yu, Han; Yang, Shuting; Ding, Steven X.; Dai, Zhongcheng; Yin, Shen:
A Data-Driven Fault Detection Scheme for Complex Industrial Systems Using Riemannian Metric and Randomized Algorithms
In: IEEE International Symposium on Industrial Electronics - 29th International Symposium on Industrial Electronics (ISIE), 17-19 June 2020, Delft, Netherlands - Piscataway: Institute of Electrical and Electronics Engineers Inc., 2020, pp. 1193 - 1198
2020book article/chapter in Proceedings
Electrical Engineering and Information TechnologyFaculty of Engineering » Engineering and Information Technology » Automatic Control and Complex Systems
Title in English:
A Data-Driven Fault Detection Scheme for Complex Industrial Systems Using Riemannian Metric and Randomized Algorithms
Author:
Yu, Han
;Yang, Shuting
;Ding, Steven X.UDE
GND
134302427
LSF ID
2347
ORCID
0000-0002-5149-5918ORCID iD
Other
connected with university
;Dai, Zhongcheng
;Yin, Shen
DOI
10.1109/ISIE45063.2020.9152552
IEEE ID
9152552
Scopus ID
85089518188
Language of text:
English
Appears in
IEEE International Symposium on Industrial Electronics
Conference
29th International Symposium on Industrial Electronics (ISIE), 17-19 June 2020, Delft, Netherlands
Place of publication:
Piscataway
Publisher:
Institute of Electrical and Electronics Engineers Inc.
Year of publication:
2020
in:
pp. 1193 - 1198
ISBN
9781728156354
ISBN
978-1-7281-5634-7
ISBN
978-1-7281-5636-1
Keyword, Topic:
Data driven ; fault detection ; randomized algorithms ; Riemannian metric ; uncertainties