A new soft-sensor-based process monitoring scheme incorporating infrequent KPI measurements
In: IEEE Transactions on Industrial Electronics (T-IE), Vol. 62 (2015), No. 6, pp. 3843 - 3851
2015article/chapter in journal
Electrical Engineering and Information TechnologyFaculty of Engineering » Engineering and Information Technology » Automatic Control and Complex Systems
Related: 1 publication(s)
Title in English:
A new soft-sensor-based process monitoring scheme incorporating infrequent KPI measurements
Author:
Shardt, Yuri A. W.;Hao, Haiyang;Ding, Steven X.UDE
- GND
- 134302427
- LSF ID
- 2347
- ORCID
-
0000-0002-5149-5918
- Other
- connected with university
Year of publication:
2015
IEEE ID
Language of text:
English
Title in English (abbreviated):
IEEE Trans Ind Electron
Place of publication:
Piscataway
Publisher:
IEEE
in:
Vol. 62 (2015), No. 6, pp. 3843 - 3851
ISSN
ISSN
ISSN
ZDB ID
Library shelfmark:
Type of resource:
Text