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Jerman, Martin: Refractive index of thin films of SiO2, ZrO2, and HfO2 as a function of the films' mass density
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Entry no. 26257
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Jerman, Martin; Qiao, Zhaohui; Mergel, Dieter:
Refractive index of thin films of SiO2, ZrO2, and HfO2 as a function of the films' mass density
In: Applied Optics,
Vol.
44 (2005), No. 15, pp. 3006 - 3012
2005
article/chapter in journal
Physics (incl. Astronomy)
Related:
1 publication(s)
Title:
Refractive index of thin films of SiO2, ZrO2, and HfO2 as a function of the films' mass density
Author:
Jerman, Martin
UDE
LSF ID
47854
Other
connected with university
;
Qiao, Zhaohui;
Mergel, Dieter
UDE
LSF ID
10490
Other
connected with university
Year of publication:
2005
Appears in
Applied Optics
Title in English (abbreviated):
Appl. Opt.
Place of publication:
Washington
Publisher:
Optica Publishing Group
in:
Vol.
44 (2005), No. 15, pp. 3006 - 3012
ISSN
2155-3165
ISSN
1559-128X
ISSN
1539-4522
ISSN
0003-6935
ISSN
1540-8981
ZDB ID
1474462-4