Liu, Ruijie; Yang, Ying; Li, Linlin; Ding, Steven X.:
Key Performance Indicators Based Fault Detection and Isolation Using Data-Driven Approaches
In: IEEE Transactions on Circuits and Systems, Part II : Express Briefs, Vol. 68 (2021), No. 1, pp. 291 - 295
2021article/chapter in journalClosed access
Electrical Engineering and Information TechnologyFaculty of Engineering » Engineering and Information Technology » Automatic Control and Complex Systems
Related: 1 publication(s)
Title in English:
Key Performance Indicators Based Fault Detection and Isolation Using Data-Driven Approaches
Author:
Liu, Ruijie
;Yang, Ying
Other
corresponding author
;Li, LinlinUDE
LSF ID
12202
ORCID
0000-0002-6387-6013ORCID iD
Other
connected with university
;Ding, Steven X.UDE
GND
134302427
LSF ID
2347
ORCID
0000-0002-5149-5918ORCID iD
Other
connected with university
Year of publication:
2021
Open Access?:
Closed access
DOI
10.1109/TCSII.2020.2993306
IEEE ID
9090325
Web of Science ID
000603475200057
Scopus ID
85098270102
Language of text:
English
Appears in
IEEE Transactions on Circuits and Systems, Part II : Express Briefs
Title in English (abbreviated):
IEEE Trans. Circuits Syst. Express Briefs
Place of publication:
New York
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)
in:
Vol. 68 (2021), No. 1, pp. 291 - 295
ISSN
1558-3791 Show availability online & print
ISSN
1549-7747 Show availability online & print
ZDB ID
2028232-1
Library shelfmark:
88 Z 69
Note:
seit 51.2004
Preceding:
IEEE Transactions on Circuits and Systems, Part II : Analog and Digital Signal Processing
Keyword, Topic:
fault detection and isolation ; generalized likelihood ratio based reconstruction ; Key performance indicators ; subspace-aided approach
Type of resource:
Text