Chen, Hongtian; Jiang, Bin; Ding, Steven X.:
A Broad Learning Aided Data-Driven Framework of Fast Fault Diagnosis for High-Speed Trains
In: IEEE Intelligent Transportation Systems Magazine, Vol. 13 (2021), No. 3, pp. 83 - 88
2021article/chapter in journalClosed access
Electrical Engineering and Information TechnologyFaculty of Engineering » Engineering and Information Technology » Automatic Control and Complex Systems
Related: 1 publication(s)
Title in English:
A Broad Learning Aided Data-Driven Framework of Fast Fault Diagnosis for High-Speed Trains
Author:
Chen, Hongtian
;
Jiang, Bin
Other
corresponding author
;
Ding, Steven X.UDE
GND
134302427
LSF ID
2347
ORCID
0000-0002-5149-5918ORCID iD
Other
connected with university
Year of publication:
2021
Open Access?:
Closed access
IEEE ID
Web of Science ID
Scopus ID
Language of text:
English
Type of resource:
Text