Luo, H.; Ding, Steven X.; Zhang, K.; Yin, S. (Eds.):
A data-driven fault detection approach for static processes with deterministic disturbances
In: 2014 IEEE 23rd International Symposium on Industrial Electronics (ISIE 2014) : proceedings - 23rd International Symposium on Industrial Electronics (ISIE 2014) : Istanbul, Turkey, 1 - 4 June 2014 - Piscataway, NJ: IEEE, 2014, pp. 2404 - 2409
2014book article/chapter in Proceedings
Electrical Engineering and Information TechnologyFaculty of Engineering » Engineering and Information Technology » Automatic Control and Complex Systems
Title in English:
A data-driven fault detection approach for static processes with deterministic disturbances
Editor:
Luo, H.;Ding, Steven X.UDE
GND
134302427
LSF ID
2347
ORCID
0000-0002-5149-5918ORCID iD
Other
connected with university
;Zhang, K.;Yin, S.
DOI
10.1109/ISIE.2014.6864996
Language of text:
English
Appears in
2014 IEEE 23rd International Symposium on Industrial Electronics (ISIE 2014) : proceedings
Conference
23rd International Symposium on Industrial Electronics (ISIE 2014) : Istanbul, Turkey, 1 - 4 June 2014
Place of publication:
Piscataway, NJ
Publisher:
IEEE
Year of publication:
2014
in:
pp. 2404 - 2409
ISBN
978-1-4799-2400-4
ISBN
978-1-4799-2399-1