Hao, Haiyang; Zhang, Kai; Ding, Steven X.; Chen, Zhiwen; Lei, Yaguo; Hu, Zhikun:
A KPI-Related Multiplicative Fault Diagnosis Scheme for Industrial Processes
In: 10th IEEE International Conference on Control and Automation (ICCA), 2013 - 10th IEEE International Conference on Control and Automation (ICCA), 2013 : 12 - 14 June 2013, Hangzhou, China - Piscataway: IEEE, 2013, pp. 1460 - 1465
2013book article/chapter in Proceedings
Electrical Engineering and Information TechnologyFaculty of Engineering » Engineering and Information Technology » Automatic Control and Complex Systems
Title in English:
A KPI-Related Multiplicative Fault Diagnosis Scheme for Industrial Processes
Author:
Hao, Haiyang;Zhang, Kai;Ding, Steven X.UDE
GND
134302427
LSF ID
2347
ORCID
0000-0002-5149-5918ORCID iD
Other
connected with university
;Chen, ZhiwenUDE
LSF ID
53691
ORCID
0000-0002-4759-0904ORCID iD
Other
connected with university
;Lei, Yaguo;Hu, Zhikun
DOI
10.1109/ICCA.2013.6565167
IEEE ID
6565167
Scopus ID
84882445850
Language of text:
English
Appears in
10th IEEE International Conference on Control and Automation (ICCA), 2013
Conference
10th IEEE International Conference on Control and Automation (ICCA), 2013 : 12 - 14 June 2013, Hangzhou, China
Place of publication:
Piscataway
Publisher:
IEEE
Year of publication:
2013
in:
pp. 1460 - 1465
ISBN
978-1-4673-4707-5
ISBN
9781467347082
Type of resource:
Text