Zhang, Kai; Shardt, Yuri A. W.; Chen, Zhiwen; Yang, Xu; Ding, Steven X.; Peng, Kaixiang:
A KPI-based process monitoring and fault detection framework for large-scale processes
In: ISA Transactions, Vol. 68 (2017), pp. 276 - 286
2017article/chapter in journalClosed access
Electrical Engineering and Information TechnologyFaculty of Engineering » Engineering and Information Technology » Automatic Control and Complex Systems
Related: 1 publication(s)
Title in English:
A KPI-based process monitoring and fault detection framework for large-scale processes
Author:
Zhang, Kai
;Shardt, Yuri A. W.
Other
corresponding author
;Chen, ZhiwenUDE
LSF ID
53691
ORCID
0000-0002-4759-0904ORCID iD
Other
connected with university
;Yang, Xu
;Ding, Steven X.UDE
GND
134302427
LSF ID
2347
ORCID
0000-0002-5149-5918ORCID iD
Other
connected with university
;Peng, Kaixiang
Year of publication:
2017
Open Access?:
Closed access
DOI
10.1016/j.isatra.2017.01.029
Scopus ID
85012890320
Language of text:
English
Appears in
ISA Transactions
Title in English (abbreviated):
ISA Trans
Place of publication:
Kidlington
Publisher:
ISA - Instrumentation, Systems, and Automation Society
in:
Vol. 68 (2017), pp. 276 - 286
ISSN
0019-0578 Show availability online & print
ISSN
1879-2022 Show availability online & print
ZDB ID
2012746-7
Library shelfmark:
79 Z 112
Keyword, Topic:
Data-driven subspace ; KPI ; Large-scale ; Least square ; Process monitoring
Type of resource:
Text
DESTATIS Subject Classification:
7100 Elektrotechnik allgemein