Chen, Zhiwen; Liu, Chang; Ding, Steven X.; Peng, Tao; Yang, Chunhua; Gui, Weihua; Shardt, Yuri A. W.:
A Just-In-Time-Learning-Aided Canonical Correlation Analysis Method for Multimode Process Monitoring and Fault Detection
In: IEEE Transactions on Industrial Electronics (T-IE), Vol. 68 (2021), No. 6, pp. 5259 - 5270
2021article/chapter in journalClosed access
Electrical Engineering and Information TechnologyFaculty of Engineering » Engineering and Information Technology » Automatic Control and Complex Systems
Related: 1 publication(s)
Title in English:
A Just-In-Time-Learning-Aided Canonical Correlation Analysis Method for Multimode Process Monitoring and Fault Detection
Author:
Chen, ZhiwenUDE
LSF ID
53691
ORCID
0000-0002-4759-0904ORCID iD
Other
connected with university
;Liu, Chang
Other
corresponding author
;Ding, Steven X.UDE
GND
134302427
LSF ID
2347
ORCID
0000-0002-5149-5918ORCID iD
Other
connected with university
;Peng, Tao
Other
corresponding author
;Yang, Chunhua
;Gui, Weihua
;Shardt, Yuri A. W.
Year of publication:
2021
Open Access?:
Closed access
DOI
10.1109/TIE.2020.2989708
IEEE ID
9080560
Web of Science ID
000621470900064
Scopus ID
85101780215
Language of text:
English
Appears in
IEEE Transactions on Industrial Electronics (T-IE)
Title in English (abbreviated):
IEEE Trans Ind Electron
Place of publication:
Piscataway
Publisher:
IEEE
in:
Vol. 68 (2021), No. 6, pp. 5259 - 5270
ISSN
1557-9948 Show availability online & print
ISSN
0278-0046 Show availability online & print
ISSN
0018-9421 Show availability online & print
ZDB ID
2027527-4
Library shelfmark:
88 Z 16
Keyword, Topic:
Canonical correlation analysis (CCA) ; data driven ; just-in-time learning (JITL) ; multimode process monitoring
Type of resource:
Text