Beer, Maik; Schrey, Olaf; Hosticka, Bedrich; Kokozinski, Rainer:
Dead time effects in the indirect time-of-flight measurement with SPADs
In: From dreams to innovation : ISCAS 2017 - IEEE International Symposium of Circuits & Systems ; Baltimore, MD, USA, May 28-31, 2017 ; 2017 conference proceedings - IEEE International Symposium of Circuits & Systems (ISCAS) ; May 28-31, 2017, Baltimore, MD, USA - Piscataway: IEEE, 2017, pp. 505 - 508
2017book article/chapter in Proceedings
Materials EngineeringElectrical Engineering and Information TechnologyFaculty of Engineering » Engineering and Information Technology » Elektronische Bauelemente und Schaltungen
Title in English:
Dead time effects in the indirect time-of-flight measurement with SPADs
Author:
Beer, Maik
;Schrey, Olaf
;Hosticka, BedrichUDE
GND
1208538586
LSF ID
1309
Other
connected with university
;Kokozinski, RainerUDE
GND
173084451
LSF ID
50200
ORCID
0000-0003-3416-3310ORCID iD
Other
connected with university
DOI
10.1109/ISCAS.2017.8050357
IEEE ID
8050357
Scopus ID
85032674459
Language of text:
English
Appears in
From dreams to innovation : ISCAS 2017 - IEEE International Symposium of Circuits & Systems ; Baltimore, MD, USA, May 28-31, 2017 ; 2017 conference proceedings
Conference
IEEE International Symposium of Circuits & Systems (ISCAS) ; May 28-31, 2017, Baltimore, MD, USA
Place of publication:
Piscataway
Publisher:
IEEE
Year of publication:
2017
in:
pp. 505 - 508
ISBN
978-1-4673-6853-7
ISBN
978-1-5090-1427-9
ISBN
978-1-4673-6852-0
Keyword, Topic:
dead time ; photon counting ; pulsed light ; range imaging ; single-photon avalanche diode (SPAD) ; time-of-flight (TOF)