Comparison of ion beam and electron beam induced transport of hot charge carriers in metal-insulator-metal junctions
In: Ion beams : new applications from mesoscale to nanoscale - 2011 MRS Spring Meeting, April 25 - 29, San Francisco, California, USA - New York: Cambridge Univ. Press, 2011 - (Materials Research Society symposium proceedings ; 1354)
2011book article/chapter in Proceedings
ChemistryFaculty of PhysicsFaculty of Chemistry » Physikalische Chemie
Title:
Comparison of ion beam and electron beam induced transport of hot charge carriers in metal-insulator-metal junctions
Author:
Hopster, JohannesUDE
- LSF ID
- 51552
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- connected with university
- LSF ID
- 11102
- ORCID
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- connected with university
- GND
- 1247767086
- LSF ID
- 10403
- ORCID
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- connected with university
- GND
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- LSF ID
- 10367
- ORCID
- 0000-0002-5785-1186
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- connected with university
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