Haghani, Adel; Ding, Steven X.; Jeinsch, Torsten; Hao, Haiyang; Luo, Hao:
MAP criterion for condition-based maintenance in industrial processes
In: 2013 Conference on Control and Fault-Tolerant Systems (SysTol 2013) - Conference on Control and Fault-Tolerant Systems (SysTol), 2013, 9 - 11 Oct. 2013, Hotel Le Negresco, Nice, France - Piscataway: IEEE, 2013, pp. 413 - 418
2013book article/chapter in Proceedings
Electrical Engineering and Information TechnologyFaculty of Engineering » Engineering and Information Technology » Automatic Control and Complex Systems
Title in English:
MAP criterion for condition-based maintenance in industrial processes
Author:
Haghani, AdelUDE
LSF ID
52408
Other
connected with university
;Ding, Steven X.UDE
GND
134302427
LSF ID
2347
ORCID
0000-0002-5149-5918ORCID iD
Other
connected with university
;Jeinsch, Torsten
;Hao, Haiyang
;Luo, HaoUDE
LSF ID
54702
ORCID
0000-0003-2143-2438ORCID iD
Other
connected with university
DOI
10.1109/SysTol.2013.6693914
IEEE ID
6693914
Scopus ID
84897704886
Language of text:
English
Appears in
2013 Conference on Control and Fault-Tolerant Systems (SysTol 2013)
Conference
Conference on Control and Fault-Tolerant Systems (SysTol), 2013, 9 - 11 Oct. 2013, Hotel Le Negresco, Nice, France
Place of publication:
Piscataway
Publisher:
IEEE
Year of publication:
2013
in:
pp. 413 - 418
ISBN
9781479928552
ISSN
2162-1209 Show availability online & print
Keyword, Topic:
Corrective action ; Data-driven methods ; Decision making ; Fault detection and isolation ; Quality monitoring
Type of resource:
Text