Chen, Zhiwen; Ding, Steven X.; Luo, Hao; Zhang, Kai:
An alternative data-driven fault detection scheme for dynamic processes with deterministic disturbances
In: Journal of the Franklin Institute, Vol. 354 (2017), No. 1, pp. 556 - 570
2017article/chapter in journalClosed access
Mechanical EngineeringFaculty of Engineering » Engineering and Information Technology » Automatic Control and Complex Systems
Related: 1 publication(s)
Title in English:
An alternative data-driven fault detection scheme for dynamic processes with deterministic disturbances
Author:
Chen, ZhiwenUDE
LSF ID
53691
ORCID
0000-0002-4759-0904ORCID iD
Other
connected with university
corresponding author
;Ding, Steven X.UDE
GND
134302427
LSF ID
2347
ORCID
0000-0002-5149-5918ORCID iD
Other
connected with university
;Luo, HaoUDE
LSF ID
54702
ORCID
0000-0003-2143-2438ORCID iD
Other
connected with university
;Zhang, Kai
Year of publication:
2017
Open Access?:
Closed access
DOI
10.1016/j.jfranklin.2016.10.031
Scopus ID
85006164677
Language of text:
English
Appears in
Journal of the Franklin Institute
Title in English (abbreviated):
J. Franklin Inst.
Place of publication:
Amsterdam
Publisher:
Elsevier
in:
Vol. 354 (2017), No. 1, pp. 556 - 570
ISSN
0016-0032 Show availability online & print
ISSN
1879-2693 Show availability online & print
ISSN
0093-7029 Show availability online & print
ZDB ID
2007754-3
Library shelfmark:
58 F 3
Type of resource:
Text
DESTATIS Subject Classification:
7100 Elektrotechnik allgemein