Haghani, Adel; Jeinsch, Torsten; Ding, Steven X.:
Quality-related fault detection in industrial multimode dynamic processes
In: IEEE Transactions on Industrial Electronics (T-IE), Vol. 61 (2014), No. 11, pp. 6446 - 6453
2014article/chapter in journal
TechnologyFaculty of Engineering » Engineering and Information Technology » Automatic Control and Complex Systems
Related: 1 publication(s)
Title:
Quality-related fault detection in industrial multimode dynamic processes
Author:
Haghani, Adel;Jeinsch, Torsten;Ding, Steven X.UDE
GND
134302427
LSF ID
2347
ORCID
0000-0002-5149-5918ORCID iD
Other
connected with university
Year of publication:
2014
DOI
10.1109/TIE.2014.2311409
IEEE ID
6766220
Language of text:
English
Appears in
IEEE Transactions on Industrial Electronics (T-IE)
Title in English (abbreviated):
IEEE Trans Ind Electron
Place of publication:
Piscataway
Publisher:
IEEE
in:
Vol. 61 (2014), No. 11, pp. 6446 - 6453
ISSN
1557-9948 Show availability online & print
ISSN
0278-0046 Show availability online & print
ISSN
0018-9421 Show availability online & print
ZDB ID
2027527-4
Library shelfmark:
88 Z 16
Type of resource:
Text