Sekunda, Andre; Ding, Steven X.; Kjolstad Poulsen, Niels; Niemann, Henrik:
Closed Loop Fault Detectability Based on a Gap-Metric
In: 2018 IEEE Conference on Control Technology and Applications - CCTA, 21-24 Aug. 2018 - Piscataway: Institute of Electrical and Electronics Engineers Inc., 2018, pp. 380 - 385
2018book article/chapter in Proceedings
Electrical Engineering and Information TechnologyFaculty of Engineering » Engineering and Information Technology » Automatic Control and Complex Systems
Title in English:
Closed Loop Fault Detectability Based on a Gap-Metric
Author:
Sekunda, Andre
;Ding, Steven X.UDE
GND
134302427
LSF ID
2347
ORCID
0000-0002-5149-5918ORCID iD
Other
connected with university
;Kjolstad Poulsen, Niels
;Niemann, Henrik
DOI
10.1109/CCTA.2018.8511620
Scopus ID
85056875451
Language of text:
English
Appears in
2018 IEEE Conference on Control Technology and Applications
Conference
CCTA, 21-24 Aug. 2018
Place of publication:
Piscataway
Publisher:
Institute of Electrical and Electronics Engineers Inc.
Year of publication:
2018
in:
pp. 380 - 385
ISBN
978-1-5386-7698-1
ISBN
978-1-5386-7699-8