Tang, Zhaohui; Zhang, Jin; Xie, Yongfang; Ding, Steven X.; Ai, Mingxi:
Semisupervised Contrastive Memory Network for Industrial Process Working Condition Monitoring
In: IEEE Transactions on Instrumentation and Measurement, Vol. 72 (2023), Article 5025110
2023article/chapter in journalClosed access
Electrical Engineering and Information TechnologyFaculty of Engineering » Engineering and Information Technology » Automatic Control and Complex Systems
Related: 1 publication(s)
Title in English:
Semisupervised Contrastive Memory Network for Industrial Process Working Condition Monitoring
Author:
Tang, Zhaohui
ORCID
0000-0003-4132-4987ORCID iD
;Zhang, Jin
ORCID
0000-0001-7574-2808ORCID iD
Other
corresponding author
;Xie, Yongfang
ORCID
0000-0002-2060-6574ORCID iD
;Ding, Steven X.UDE
GND
134302427
LSF ID
2347
ORCID
0000-0002-5149-5918ORCID iD
Other
connected with university
;Ai, Mingxi
ORCID
0000-0002-0284-2995ORCID iD
Year of publication:
2023
Open Access?:
Closed access
DOI
10.1109/TIM.2023.3311070
IEEE ID
10237237
Scopus ID
85170517466
Language of text:
English
Appears in
IEEE Transactions on Instrumentation and Measurement
Title in English (abbreviated):
IEEE Trans Instrum Meas
Place of publication:
New York
Publisher:
IEEE
in:
Vol. 72 (2023), Article 5025110
ISSN
1557-9662 Show availability online & print
ISSN
0018-9456 Show availability online & print
ZDB ID
2027532-8
Library shelfmark:
88 I 3
Keyword, Topic:
Automation ; Cognition ; computer vision ; Data models ; deep learning ; memory network ; Monitoring ; Perturbation methods ; Predictive models ; Process monitoring ; semi-supervised learning ; Training
Type of resource:
Text
DESTATIS Subject Classification:
7100 Elektrotechnik allgemein