Chen, Hongtian; Jiang, Bin; Ding, Steven X.; Huang, Biao:
Data-Driven Fault Diagnosis for Traction Systems in High-Speed Trains : A Survey, Challenges, and Perspectives
In: IEEE Transactions on Intelligent Transportation Systems (T-ITS), Vol. 23 (2022), No. 3, pp. 1700 - 1716
2022article/chapter in journalClosed access
Electrical Engineering and Information TechnologyFaculty of Engineering » Engineering and Information Technology » Automatic Control and Complex Systems
Related: 1 publication(s)
Title in English:
Data-Driven Fault Diagnosis for Traction Systems in High-Speed Trains : A Survey, Challenges, and Perspectives
Author:
Chen, Hongtian
ORCID
0000-0002-8600-9668ORCID iD
Other
corresponding author
;Jiang, Bin
ORCID
0000-0003-3458-9303ORCID iD
;Ding, Steven X.UDE
GND
134302427
LSF ID
2347
ORCID
0000-0002-5149-5918ORCID iD
Other
connected with university
;Huang, Biao
Year of publication:
2022
Open Access?:
Closed access
DOI
10.1109/TITS.2020.3029946
IEEE ID
9237134
Web of Science ID
000767865500005
Scopus ID
85127915321
Language of text:
English
Appears in
IEEE Transactions on Intelligent Transportation Systems (T-ITS)
Title in English (abbreviated):
IEEE Trans Intell Transport Syst
Place of publication:
Piscataway
Publisher:
IEEE
in:
Vol. 23 (2022), No. 3, pp. 1700 - 1716
ISSN
1524-9050 Show availability online & print
ISSN
1558-0016 Show availability online & print
ZDB ID
2034300-0
Library shelfmark:
91 Z 404
Keyword, Topic:
Data-driven ; fault detection and diagnosis (FDD) ; high-speed trains ; traction systems
Type of resource:
Text
DESTATIS Subject Classification:
7100 Elektrotechnik allgemein