Krenzer, Boris; Hanisch-Blicharski, Anja; Schneider, P.; Payer, Thomas; Möllenbeck, Simone; Osmani, Orkahn; Kammler, Martin; Meyer, Ralf; Horn-von Hoegen, Michael:
Phonon confinement effects in ultrathin epitaxial bismuth films on silicon studied by time-resolved electron diffraction
In: Physical Review B : Condensed matter and materials physics, Vol. 80 (2009), No. 2, p. 24307
2009article/chapter in journal
Physics (incl. Astronomy)Faculty of Physics » Experimental PhysicsScientific institutes » Center for Nanointegration Duisburg-Essen (CENIDE)
Related: 1 publication(s)
Title in English:
Phonon confinement effects in ultrathin epitaxial bismuth films on silicon studied by time-resolved electron diffraction
Author:
Krenzer, Boris;Hanisch-Blicharski, AnjaUDE
LSF ID
12007
Other
connected with university
;Schneider, P.;Payer, ThomasUDE
LSF ID
46752
Other
connected with university
;Möllenbeck, Simone;Osmani, OrkahnUDE
LSF ID
49749
Other
connected with university
;Kammler, MartinUDE
LSF ID
50189
Other
connected with university
;Meyer, RalfUDE
LSF ID
13388
Other
connected with university
;Horn-von Hoegen, MichaelUDE
GND
1201039908
LSF ID
10366
ORCID
0000-0003-0324-3457ORCID iD
Other
connected with university
Year of publication:
2009
DOI
10.1103/PhysRevB.80.024307
Language of text:
English
Appears in
Physical Review B : Condensed matter and materials physics
Place of publication:
College Park
Publisher:
American Physical Society (APS)
in:
Vol. 80 (2009), No. 2, p. 24307
ISSN
1550-235X Show availability online & print
ISSN
2469-9969 Show availability online & print
ISSN
1098-0121 Show availability online & print
ISSN
2469-9950 Show availability online & print
ZDB ID
1473011-X
Library shelfmark:
67 P 5
Note:
1.1970 - 92.2015
Succeeding:
Physical Review B