Critical behavior of strained epitaxial Gd films: In situ ac-susceptiblity measurements in UHV.

Stetter, U.; Farle, Michael; Baberschke, K.; Clark, W.G.:

In: Physical Review B : Condensed matter and materials physics, Vol. 45 (1992), pp. 503 - 506

1992article/chapter in journal

Physics (incl. Astronomy)

Title:

Critical behavior of strained epitaxial Gd films: In situ ac-susceptiblity measurements in UHV.

Author:

Stetter, U.;Farle, Michael^UDE;Baberschke, K.;Clark, W.G.

Year of publication:

1992

Appears in

Place of publication:

College Park

Publisher:

American Physical Society (APS)

in:

Vol. 45 (1992), pp. 503 - 506

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Note:

1.1970 - 92.2015

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University bibliography